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Intrinsic carrier concentration and Fermi level calculator

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KEY POINTS

The intrinsic carrier concentration is ni = √(NcNv)·exp(−Eg/2kT), about 1×10¹⁰ cm⁻³ for silicon at 300 K. In a doped semiconductor the majority carrier concentration is roughly |ND − NA|, and the Fermi level moves about 60 meV closer to the band edge for each tenfold increase in concentration at room temperature. SiC and GaN, with their wide band gaps, keep ni small at high temperature and stay extrinsic above 300 °C.

Inputs

Intrinsic carrier concentration ni1.07×10¹⁰cm⁻³
Electron concentration n1.00×10¹⁶cm⁻³
Hole concentration p11,400cm⁻³
Band gap Eg(T)1.1245eV
Ec − EF0.2057eV
EF − Ev0.9188eV
EF − Ei (positive means n-type side)0.3555eV
Thermal energy kT25.85meV

Band diagram (Fermi level position)

EcEvEiEFEg

Ei is the intrinsic Fermi level. EF moves toward Ec in n-type material and toward Ev in p-type material.

Change with temperature

Silicon (Si), ND = 1.00×10¹⁶, NA = 0 cm⁻³.
Temperatureni [cm⁻³]Majority carriers [cm⁻³]Regime
250 K (-23 °C)7.90×10⁷1.00×10¹⁶Extrinsic
300 K (27 °C)1.07×10¹⁰1.00×10¹⁶Extrinsic
400 K (127 °C)5.63×10¹²1.00×10¹⁶Extrinsic
500 K (227 °C)2.72×10¹⁴1.00×10¹⁶Extrinsic
600 K (327 °C)3.89×10¹⁵1.13×10¹⁶Transition
800 K (527 °C)1.23×10¹⁷1.29×10¹⁷Intrinsic (doping no longer controls)
10⁻¹⁰10⁻⁹10⁻⁸10⁻⁷10⁻⁶10⁻⁵10⁻⁴10⁻³10⁻²10⁻¹10⁰10¹10²10³10⁴10⁵10⁶10⁷10⁸10⁹10¹⁰10¹¹10¹²10¹³10¹⁴10¹⁵10¹⁶10¹⁷10¹⁸10¹⁹200300400500600700800Temperature (K)ni (cm⁻³)
Silicon (Si)Germanium (Ge)Gallium arsenide (GaAs)4H-SiCGallium nitride (GaN)

Once ni approaches the intended doping level, the conductivity type set by doping can no longer be maintained. The slope of this graph and the difference in band gap explain why silicon devices are limited to around 150 °C while SiC and GaN can operate above 300 °C.

Understanding ni and the Fermi level

The intrinsic carrier concentration ni is the concentration of electrons (equal to holes) created by thermal excitation in an undoped semiconductor. It depends on the band gap Eg through exp(−Eg/2kT), so a 1 eV difference in Eg changes ni at room temperature by more than eight orders of magnitude. Silicon has about 1×10¹⁰ cm⁻³ at 300 K, while 4H-SiC has only around 10⁻⁸ cm⁻³.

In a doped semiconductor, charge neutrality sets the majority carrier concentration at roughly |ND − NA|, and the minority carriers follow from the mass action law np = ni². The Fermi level expresses carrier concentration on a log scale: each tenfold increase moves it about 60 meV closer to the band edge at room temperature.

FAQ


Why can SiC devices run hotter than silicon?

ni depends exponentially on band gap. With a band gap about three times that of silicon, 4H-SiC keeps ni far below its doping level even above 300 °C, so it stays extrinsic.

When does this calculation lose accuracy?

When the Fermi level comes within 3kT of a band edge (degenerate doping), and for wide band gap materials whose deep dopants are not fully ionized at room temperature.

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Last updated: October 23, 2026