EHS series HAST chambers (standard type)
A HAST chamber with functions designed mainly around bias testing. It supports IEC 60068-2-66.
Maker: ESPEC · Official product page
Specifications
| Test method | HAST (unsaturated, pressurized) |
|---|---|
| Control modes | Unsaturated control and wet saturated control (2 modes) |
| Test range | +105.0 to +142.9 °C, 75 to 100 %RH, 0.020 to 0.196 MPa (high-pressure type up to +162.2 °C and 0.392 MPa) |
| Standards | IEC 60068-2-66 |
| Main applications | Humidity bias testing of semiconductor packages and electronic components |
Specifications as published by the maker. See the sources below.
Overview
The EHS series are ESPEC's highly accelerated stress test (HAST) systems. They combine high-temperature, high-humidity and pressure stress to evaluate the reliability of electrical and electronic components in a short time. They are used, for example, to evaluate the moisture resistance of semiconductor packages.
EHS-212/222 cover 105.0 to 142.9 °C, 75 to 100 %RH and 0.020 to 0.196 MPa (gauge), and EHS-412 covers 105.0 to 162.2 °C, 75 to 100 %RH and 0.020 to 0.392 MPa. Standard models have unsaturated control and wet saturated control, and M types also have wet- and dry-bulb temperature control in line with IEC 60068-2-66.
A cylindrical double-wall structure and ESPEC's own air conditioning technology prevent condensation and water droplets on samples, and a stirring fan reduces temperature and humidity variation to apply uniform stress. The Air-HAST option, which leaves air in the chamber to reproduce oxygen-related degradation, is useful for evaluating whiskers in lead-free solder on mounted boards. EHS-222M-L for large samples handles boards of about 470 × 290 mm and bias application to up to 120 pins (1000 V / 1 A).
Key features
- Up to 142.9 °C / 162.2 °C, 75 to 100 %RH, pressurized
- Unsaturated, wet saturated and wet/dry-bulb temperature control (M type)
- Cylindrical double-wall structure prevents condensation and droplets
- Air-HAST option and large-sample model
Applications
- Moisture resistance testing (HAST) of semiconductor packages and electronic components
- Whisker evaluation of lead-free solder
More from ESPEC
- Platinous J series · Temperature and humidity test chambers
- RBC series burn-in chambers · Burn-in systems
- TSA series thermal shock chambers · Thermal shock test chambers
Sources
Last updated: October 23, 2026