530-IT
TESEC's test system that combines power device test functions with IC test functions.
Maker: TESEC · Official product page
Specifications
| Target devices | IPDs (intelligent power devices), IPMs |
|---|---|
| System configuration | Combined power device test + IC test |
| Main applications | Electrical testing of power devices with built-in control circuits |
Specifications as published by the maker. See the sources below.
Overview
530-IT is TESEC's test system for intelligent power devices. It specializes in evaluating integrated power devices that combine logic circuits with power semiconductors.
Targets include 3-phase DC-AC inverters, gate-controlled half-bridge IPDs/IPMs, SiC MOSFETs, GaN HEMTs, IGBTs and diodes. It handles voltages up to 2.2 kV and currents of 67 A as standard (expandable to 130 A or 200 A). Up to 2 test stations can be built in, allowing 2 devices to be measured at once. Resolution is 4 digits for bias and 5 digits for measurement.
It offers fast leakage current measurement, flexible bias waveforms and timing control, and an interface for creating recipes without a programming language. It is optimized for testing modern power semiconductors with built-in protection and control circuits that require high reliability, such as EV inverters, motor control, industrial equipment and smart power modules.
Key features
- Up to 2.2 kV, 67 A as standard (expandable to 200 A)
- Up to 2 test stations, 2 devices measured at once
- Fast leakage current measurement and flexible bias waveforms
- Recipe creation without a programming language
Applications
- Electrical testing of IPDs, IPMs and inverter modules
- Testing SiC MOSFETs, GaN HEMTs and IGBTs
Other analog test systems
- EVA100 · Advantest
- V93000 Power and Analog Solutions · Advantest
Sources
Analog test systems
Last updated: October 23, 2026