B6700 series
A memory burn-in test system that tests up to 48 burn-in boards in parallel at up to 10 MHz.
Maker: Advantest · Official product page
Specifications
| Type | Memory burn-in test (with test functions during burn-in) |
|---|---|
| Parallelism | Up to 48 burn-in boards |
| Lineup | B6700, B6700ES, B6700S (built into a multi-wafer prober) |
Specifications as published by the maker. See the sources below.
Overview
The B6700 series is Advantest's memory burn-in test system. In the growing memory market, it is used for burn-in testing that screens out early-failure devices quickly and in large volumes.
B6700 tests up to 48 burn-in boards in parallel at speeds up to 10 MHz, lowering test cost and speeding new products to market. It carries the memory test functions Advantest has developed and can run tests during burn-in. An in-house high-performance chamber improves temperature accuracy and shortens ramp times.
The series also includes B6700ES, an engineering version that keeps the functions and performance of B6700 in a smaller size, and B6700S, which is built into another maker's multi-wafer prober to perform wafer-level burn-in without extra floor space.
Key features
- Up to 48 boards tested in parallel
- Test functions during burn-in
- B6700S for wafer-level burn-in
Applications
- Memory burn-in
- Wafer-level burn-in
Other burn-in systems
- RBC series burn-in chambers · ESPEC
- BI-M series monitor burn-in systems · WINTEST
More from Advantest
Sources
Last updated: October 23, 2026