T5851 / T5851ES
A test system for protocol NAND. It comes in production and engineering models and covers everything from reliability testing to test program development.
Maker: Advantest · Official product page
Specifications
| Target devices | UFS 4.0 and PCIe Gen5 embedded NAND |
|---|---|
| High-speed module | T5851-STM32G (up to 32 Gbps) |
| Configuration | Production model / engineering model |
| Measurement method | Tester-per-DUT |
| Main applications | System-level test, reliability and characterization |
Specifications as published by the maker. See the sources below.
Overview
T5851/T5851ES is Advantest's memory test system for protocol NAND. It targets NAND flash with high-speed interfaces, such as UFS 4.0 and PCIe Gen5 embedded NAND.
There is a production model, T5851, and an engineering model, T5851ES, so reliability and qualification testing, test program development and volume production with a handler can all be done on the same family of systems. Parallelism is 512, and test speed is up to 32 Gbps.
Its tester-per-DUT architecture assigns a tester to each DUT, and it has Advantest's own hardware accelerators. The software is FutureSuite, shared across the T5800 series, and it has high-current programmable power supplies that support liquid cooling.
Key features
- Supports UFS 4.0 and PCIe Gen5 embedded NAND
- Up to 32 Gbps, parallelism of 512
- Tester-per-DUT architecture with Advantest's own hardware accelerators
- Two configurations: production model and engineering model
Applications
- System-level testing of protocol NAND
- Reliability and qualification testing, test program development
Other memory test systems
More from Advantest
- 7038 System-Level Test System · Final test equipment
- B6700 series · Burn-in systems
- EVA100 · Analog test systems
- EXAVIS · Power semiconductor manufacturing equipment
- HA1200 · Wafer probers
- HA7200 · MEMS manufacturing equipment
- HA7300 · MEMS manufacturing equipment
- M4173 · Test handlers
Sources
Last updated: October 23, 2026