Memory test systems
Memory test systems (memory ATE) test DRAM, NAND flash and other memory devices at wafer and package level. They generate the high-speed signals and algorithmic patterns that memory interfaces need and test very large numbers of devices in parallel to keep cost per device low.
What it does
Memory testers also find failing cells so that spare rows and columns can be used to repair the chip (redundancy analysis), and some combine testing with burn-in.
Products (10)
- H5620 · Advantest
A memory test system for DRAM and LPDDR that combines burn-in and memory cell testing. It tests more than 18,000 devices at once.
- T5221 · Advantest
A test system for wafer testing and wafer burn-in of NAND and other non-volatile memory, built into a multi-prober.
- T5230 · Advantest
A test system that uses a combined array architecture for cost-efficient wafer testing of NAND and other non-volatile memory.
- T5503HS2 · Advantest
A memory test system for DDR5 and LPDDR5 generation DRAM. It keeps high parallelism with many channels and automatically adjusts DQS-DQ timing.
- T5511 · Advantest
A memory test system that tests memory at 8 Gbps, among the fastest in the industry. Timing training and CRC are implemented in hardware.
- T5801 · Advantest
A memory test system for next-generation ultra-high-speed DRAM such as GDDR7, LPDDR6 and DDR6. It supports 36 Gbps with PAM3.
- T5830 · Advantest
A memory test system for flash memory from evaluation through volume production. It tests 2,304 devices at once in wafer test, the most in the industry.
- T5833 · Advantest
A multi-function memory test system that can test both mobile DRAM and NAND flash in wafer test and package test.
- T5835 · Advantest
A multi-function memory test system that tests next-generation memory from NAND to DDR and LPDDR at up to 5.4 Gbps. It tests 768 devices at once.
- T5851 / T5851ES · Advantest
A test system for protocol NAND. It comes in production and engineering models and covers everything from reliability testing to test program development.
Japanese makers in this category
- Advantest · 10 product(s) listed
Other back-end equipment
- Analog test systems (3)
- Backgrinders (9)
- Burn-in systems (3)
- Dicing saws (13)
- Electron microscopes for observation (SEM/TEM) (3)
- Final test equipment (4)
- Laser dicing equipment (9)
- Organic analysis instruments (3)
- Surface analysis instruments (XPS/SIMS) (4)
- Test handlers (5)
- Thermal analysis instruments (TG-DTA/DSC) (3)
- TSV formation equipment (4)
Sources
Related calculators
Japanese equipment by category
Last updated: October 23, 2026