T5830
A memory test system for flash memory from evaluation through volume production. It tests 2,304 devices at once in wafer test, the most in the industry.
Maker: Advantest · Official product page
Specifications
| Parallel testing | 2,304 devices (wafer), 768 devices (package) |
|---|---|
| Test speed | Up to 800 Mbps in package test |
| Target | NOR and NAND flash |
Specifications as published by the maker. See the sources below.
Overview
T5830 is Advantest's memory test system for flash memory. Its resources and functions are optimized for volume testing of flash memory, which is growing with the spread of IoT and wearable devices.
In wafer testing of flash, it can test 2,304 devices at once, the most in the industry, without splitting resources on the probe card. In package testing, it tests up to 768 devices at once at test speeds up to 800 Mbps.
It has functions well suited to volume flash testing, including all-pin I/O, three-level high-voltage drivers with real-time control, and device power supplies for testing 2,304 devices at once. It uses the common T5800 platform, with configurations from ES for engineering to DSTH and QSTH for production.
Key features
- 2,304 devices tested at once in wafer test
- Three-level high-voltage drivers
- Common T5800 platform
Applications
- Volume testing of NAND and NOR flash
Other memory test systems
More from Advantest
- 7038 System-Level Test System · Final test equipment
- B6700 series · Burn-in systems
- EVA100 · Analog test systems
- EXAVIS · Power semiconductor manufacturing equipment
- HA1200 · Wafer probers
- HA7200 · MEMS manufacturing equipment
- HA7300 · MEMS manufacturing equipment
- M4173 · Test handlers
Sources
Last updated: October 23, 2026