H5620
A memory test system for DRAM and LPDDR that combines burn-in and memory cell testing. It tests more than 18,000 devices at once.
Maker: Advantest · Official product page
Specifications
| Parallel testing | 18,432 devices (48 slots × 384) |
|---|---|
| Frequency | 100 MHz / 200 Mbps (200 MHz / 400 Mbps with a license) |
| Lineup | H5620 (production), H5620ES (engineering) |
Specifications as published by the maker. See the sources below.
Overview
H5620 is Advantest's memory test system for advanced DRAM and LPDDR. It is a hybrid solution that combines burn-in with memory cell testing.
With the spread of 5G, demand for DRAM is growing rapidly, especially in data centers and mobile, while memory prices tend to fall, so test cost has to come down even as production volume rises.
The production model H5620 can test more than 18,000 devices at once at a frequency of 100 MHz and data rates up to 200 Mbps, and it supports factory automation. The engineering model H5620ES evaluates device programs except for temperature control, reducing the time production systems are tied up. The OS is FutureSuite.
Key features
- Burn-in and cell testing combined
- 18,432 devices tested at once
- Two models for production and engineering
Applications
- Burn-in and cell testing of DRAM and LPDDR
Other memory test systems
More from Advantest
- 7038 System-Level Test System · Final test equipment
- B6700 series · Burn-in systems
- EVA100 · Analog test systems
- EXAVIS · Power semiconductor manufacturing equipment
- HA1200 · Wafer probers
- HA7200 · MEMS manufacturing equipment
- HA7300 · MEMS manufacturing equipment
- M4173 · Test handlers
Sources
Last updated: October 23, 2026