T5511
A memory test system that tests memory at 8 Gbps, among the fastest in the industry. Timing training and CRC are implemented in hardware.
Maker: Advantest · Official product page
Specifications
| Test speed | 8 Gbps (all test pins) |
|---|---|
| Timing accuracy | ±40 ps |
| Target | DRAM such as GDDR5 and DDR4 |
Specifications as published by the maker. See the sources below.
Overview
T5511 is Advantest's memory test system. It aims to test DRAM, which is evolving separately for graphics, server, client and mobile applications, on a single platform from design through volume production.
Its maximum test speed of 8 Gbps is among the fastest in the industry and handles fast GDDR5-SDRAM testing with margin. Because every test pin supports 8 Gbps, parallelism does not drop when testing at high speed. Timing accuracy is ±40 ps.
Timing training and CRC (cyclic redundancy check) code generation, which became necessary for measuring DDR4-SDRAM and GDDR5-SDRAM, are implemented in dedicated hardware to raise throughput and make test programs easier to write.
Key features
- 8 Gbps on all pins
- Timing accuracy of ±40 ps
- Timing training and CRC in hardware
Applications
- Testing of high-speed DRAM such as GDDR and DDR4
Other memory test systems
More from Advantest
- 7038 System-Level Test System · Final test equipment
- B6700 series · Burn-in systems
- EVA100 · Analog test systems
- EXAVIS · Power semiconductor manufacturing equipment
- HA1200 · Wafer probers
- HA7200 · MEMS manufacturing equipment
- HA7300 · MEMS manufacturing equipment
- M4173 · Test handlers
Sources
Last updated: October 23, 2026