T5221
A test system for wafer testing and wafer burn-in of NAND and other non-volatile memory, built into a multi-prober.
Maker: Advantest · Official product page
Specifications
| Parallel testing | Up to 1,152 devices per test station |
|---|---|
| Configuration | Up to 12 test stations controlled independently |
| Test speed | 25 MHz / 50 Mbps |
Specifications as published by the maker. See the sources below.
Overview
T5221 is Advantest's memory test system for non-volatile memory. It handles wafer testing and wafer burn-in of NAND flash and similar devices, and saves test floor space by being built into a multi-prober.
A test station is built into each stage of another maker's multi-prober, and a system controller controls up to 12 stations independently. Apart from the controller, it adds no floor space, giving the highest space efficiency among Advantest's non-volatile memory testers.
In wafer testing, up to 1,152 devices can be tested at once per test station. Faster data transfer handles the growing test data from higher-capacity 3D NAND and shortens test time compared with the previous model. The OS is the proven FutureSuite, making it easy to port programs from earlier systems.
Key features
- Built into a multi-prober
- Up to 12 stations controlled independently
- 1,152 devices tested at once per station
Applications
- Wafer testing of NAND
- Wafer burn-in
Other memory test systems
More from Advantest
- 7038 System-Level Test System · Final test equipment
- B6700 series · Burn-in systems
- EVA100 · Analog test systems
- EXAVIS · Power semiconductor manufacturing equipment
- HA1200 · Wafer probers
- HA7200 · MEMS manufacturing equipment
- HA7300 · MEMS manufacturing equipment
- M4173 · Test handlers
Sources
Last updated: October 23, 2026