M4841
A high-throughput test handler for volume production of MCUs and DSPs. It tests up to 32 devices at once at 18,500 devices per hour.
Maker: Advantest · Official product page
Specifications
| Parallel testing | Up to 32 devices (4 times the previous model) |
|---|---|
| Throughput | 18,500 devices per hour |
| Temperature range | −40 to +125 °C (−55 to +175 °C optional) |
Specifications as published by the maker. See the sources below.
Overview
M4841 is a test handler from Advantest. It tests many BGA, CSP, QFP and other packages at once with high throughput, and suits volume production of semiconductors for portable digital devices and automotive use.
Parallel testing of up to 32 devices (4 times the previous model) and a high throughput of 18,500 devices per hour (more than 3 times the previous model) lower test cost.
A thermal chamber applies temperatures from −40 °C to +125 °C (−55 °C to +175 °C as an option), supporting demanding environmental tests for automotive and aircraft applications. A modular design that lets users choose units for parallelism, temperature range and throughput optimizes investment cost. It also has ATC2.0, which responds dynamically to device temperature changes.
Key features
- Up to 32 devices tested at once
- 18,500 devices per hour
- −55 to +175 °C (optional)
- ATC2.0
Applications
- Volume testing of MCUs and DSPs
- Temperature testing of automotive semiconductors
Other test handlers
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- HA7200 · MEMS manufacturing equipment
- HA7300 · MEMS manufacturing equipment
Sources
Test handlers
Last updated: October 23, 2026