M5241
A next-generation memory handler for volume testing of DRAM, NAND and HBM. Its micro-chamber design gives temperature accuracy of ±1.0 °C.
Maker: Advantest · Official product page
Specifications
| Temperature accuracy | ±1.0 °C (micro-chamber design) |
|---|---|
| Parallelism and throughput | Up to 512 devices, up to 46,000 UPH |
| Temperature range | −40 to +125 °C (standard) |
Specifications as published by the maker. See the sources below.
Overview
M5241 is Advantest's next-generation memory handler. As demand from AI and data centers grows, testing memory ICs such as DRAM, NAND and HBM requires more accuracy, efficiency and reliability than ever.
Its micro-chamber design achieves temperature accuracy of ±1.0 °C, among the best in the industry, allowing stable evaluation of next-generation memory with high self-heating. Advantest's own sensing technology and a mechanism that prevents transfer errors greatly reduce jams, raising test line uptime.
Adjustment-free operation and one-touch change kits that need no jigs minimize the maintenance burden. Support for OHT/AMR and predictive maintenance also helps build smart factories. It docks vertically with the new T5801 tester as well as T5833, T5503HS2 and T5835, processing up to 512 devices in parallel at up to 46,000 UPH.
Key features
- Temperature accuracy of ±1.0 °C
- Up to 512 in parallel and 46,000 UPH
- Greatly reduced jams
- One-touch change kits
Applications
- Volume testing of DRAM, NAND and HBM
Other test handlers
More from Advantest
- 7038 System-Level Test System · Final test equipment
- B6700 series · Burn-in systems
- EVA100 · Analog test systems
- EXAVIS · Power semiconductor manufacturing equipment
- H5620 · Memory test systems
- HA1200 · Wafer probers
- HA7200 · MEMS manufacturing equipment
- HA7300 · MEMS manufacturing equipment
Sources
Test handlers
Last updated: October 23, 2026