T5835
A multi-function memory test system that tests next-generation memory from NAND to DDR and LPDDR at up to 5.4 Gbps. It tests 768 devices at once.
Maker: Advantest · Official product page
Specifications
| Test speed | Up to 5.4 Gbps |
|---|---|
| Parallel testing | 768 devices |
| Target | DRAM and NAND flash (package test and high-speed wafer test) |
Specifications as published by the maker. See the sources below.
Overview
T5835 is Advantest's multi-function memory test system. For next-generation memory that keeps getting faster and larger, it delivers more than twice the test speed of earlier products along with massively parallel testing.
With test speeds up to 5.4 Gbps, it broadly covers both package testing and high-speed wafer testing, from NAND flash to DDR-DRAM and LPDDR-DRAM. It can test 768 devices at once, lowering test cost with throughput among the best in the industry. It also has device power supplies with faster response for mobile memory.
Timing training, high-speed evaluation and failure analysis functions have also been expanded and sped up. It carries on the T5800 series, and configurations can be chosen from models such as STH for engineering, LTH for production and MTH for high-speed wafer probing.
Key features
- Up to 5.4 Gbps
- 768 devices tested at once
- STH, LTH and MTH test heads
Applications
- Package testing of DRAM and NAND
- High-speed wafer testing
Other memory test systems
More from Advantest
- 7038 System-Level Test System · Final test equipment
- B6700 series · Burn-in systems
- EVA100 · Analog test systems
- EXAVIS · Power semiconductor manufacturing equipment
- HA1200 · Wafer probers
- HA7200 · MEMS manufacturing equipment
- HA7300 · MEMS manufacturing equipment
- M4173 · Test handlers
Sources
Last updated: October 23, 2026