Electron microscopes for observation (SEM/TEM)
Instruments in this category image the structure of devices and materials, mainly scanning electron microscopes (SEM) and laser or optical microscopes. SEMs resolve nanometer-scale features and are often combined with EDS for elemental analysis.
What it does
They are used in failure analysis, process development and quality control, often together with cross-section sample preparation.
Products (3)
- SU7000 · Hitachi High-Tech
A Schottky field emission scanning electron microscope that acquires several signals at once to raise observation and analysis throughput.
- JSM-IT810 · JEOL
A Schottky field emission scanning electron microscope launched in 2024. It automates everything from instrument adjustment to observation and EDS analysis.
- OPTELICS® HYBRID+ · Lasertec
A hybrid laser microscope that combines white-light confocal and laser confocal (405 nm) optics.
Japanese makers in this category
- Hitachi High-Tech · 1 product(s) listed
- JEOL · 1 product(s) listed
- Lasertec · 1 product(s) listed
Other back-end equipment
- Analog test systems (3)
- Backgrinders (9)
- Burn-in systems (3)
- Dicing saws (13)
- Final test equipment (4)
- Laser dicing equipment (9)
- Memory test systems (10)
- Organic analysis instruments (3)
- Surface analysis instruments (XPS/SIMS) (4)
- Test handlers (5)
- Thermal analysis instruments (TG-DTA/DSC) (3)
- TSV formation equipment (4)
Sources
Japanese equipment by category
Electron microscopes for observation (SEM/TEM)
Last updated: October 23, 2026