Final test equipment

What it does

Besides conventional ATE, final test now includes system-level test (SLT), which runs devices as they would operate in a product, and testers built for specific devices such as power semiconductors.

Products (4)

• 7038 System-Level Test System · Advantest

  A low-cost system-level test (SLT) system for high-volume production that tests up to 720 devices at once at 5,000 UPH.

• T2000 · Advantest

  Advantest's SoC test system configured by combining functional modules. It performs low-cost volume testing of complex consumer devices.

• DIS100 · DISCO

  A chip inspection system that picks chips from diced wafers and fully automatically measures thickness, chipping, backside roughness and die strength.

• Prexa™ SDP · Tokyo Electron (TEL)

  TEL's prober for testing singulated devices. It has its own temperature control for high-heat devices.

Japanese makers in this category

• Advantest · 2 product(s) listed
• DISCO · 1 product(s) listed
• Tokyo Electron (TEL) · 1 product(s) listed

Other back-end equipment

• Analog test systems (3)
• Backgrinders (9)
• Burn-in systems (3)
• Dicing saws (13)
• Electron microscopes for observation (SEM/TEM) (3)
• Laser dicing equipment (9)
• Memory test systems (10)
• Organic analysis instruments (3)
• Surface analysis instruments (XPS/SIMS) (4)
• Test handlers (5)
• Thermal analysis instruments (TG-DTA/DSC) (3)
• TSV formation equipment (4)

Sources

1. Advantest: 7038 product page
2. Advantest: T2000 product page
3. DISCO: DIS100 product page
4. TEL: Prexa series product page

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