T2000
Advantest's SoC test system configured by combining functional modules. It performs low-cost volume testing of complex consumer devices.
Maker: Advantest · Official product page
Specifications
| Target devices | SoCs (digital, mixed analog and power, image) |
|---|---|
| Configuration | Air-cooled 9 slots to liquid-cooled 52 slots, up to 8,192 ch |
| Main modules | 1.6GDM, 8GDM (digital), DSP192A (power), GPWGD (analog) |
| Main applications | Volume testing of consumer SoCs |
Specifications as published by the maker. See the sources below.
Overview
T2000 is Advantest's SoC test system. It is positioned as a high-performance, low-cost SoC test solution for high-volume production of complex consumer devices.
Its modular architecture lets users configure the system by combining the functional modules needed for each application. Modules for digital, high-performance analog, power and mixed-signal, image capture and more cover a wide test range at optimal cost. Configurations scale from a 9-slot air-cooled system to a 52-slot liquid-cooled system with up to 8,192 channels.
Modules and functions include Multi-Time Domain, which tests several frequency domains at the same time; 1GDM and 1.6GDM, which lower test cost through high-parallel testing; DSP192A, which packs 96 ch of device power supplies at high density; GPWGD, an analog module covering audio through video; PMU32E for precise measurements such as ADC/DAC linearity; and 8GDM for testing high-speed interfaces.
Key features
- Modular architecture built by combining functional modules
- Air-cooled 9 slots to liquid-cooled 52 slots, up to 8,192 ch
- Simultaneous testing of several frequency domains with Multi-Time Domain
- Digital, analog, power and image modules
Applications
- Volume testing of consumer SoCs
- Testing of mixed analog/power devices and image sensors
Also listed under: Image sensor test systems
Other final test equipment
- 7038 System-Level Test System · Advantest
- DIS100 · DISCO
- Prexa™ SDP · Tokyo Electron (TEL)
More from Advantest
Sources
Final test equipment
Last updated: October 23, 2026