MAGICS M9650 / M9651
A defect inspection and review system for EUV mask blanks. It won the Semiconductor of the Year 2019 Grand Prix.
Maker: Lasertec · Official product page
Specifications
| Target | EUV mask blanks, optical mask blanks, substrates |
|---|---|
| Cassettes | Multi-stage cassettes, RSP, MRP, Dual Pod |
| Awards | Semiconductor of the Year 2019 Grand Prix |
Specifications as published by the maker. See the sources below.
Overview
MAGICS M9650/M9651 is Lasertec's defect inspection and review system for EUV mask blanks, announced in November 2018.
It combines the high detection sensitivity needed to inspect next-generation high-quality mask blanks with high throughput suited to outgoing and incoming inspection in volume production. Based on the core technology of MAGICS, the industry-standard mask blank inspection system, it has completely renewed inspection optics and uses high-speed inspection circuit technology developed for mask pattern inspection systems.
Detection sensitivity is greatly improved not only for substrates but also for each layer of leading-edge mask blanks. It handles everything from multi-stage cassettes for blank makers to RSP and MRP for mask shops and Dual Pods for EUVL. M9651 supports inspection of line-and-space monitor patterns.
Key features
- Technology from the industry-standard MAGICS
- High sensitivity and high throughput
- Supports many types of cassettes
Applications
- Inspection of EUV and optical mask blanks
Other mask inspection equipment
- MASK DR-SEM E5620 · Advantest
- ABICS E120 · Lasertec
- ABICS E320 · Lasertec
- ACTIS A150 · Lasertec
- ACTIS A200HiT series · Lasertec
- ACTIS A300 series · Lasertec
- BASIC series · Lasertec
- MAGICS M6750 / M6751 · Lasertec
More from Lasertec
- BGM300 · TSV formation equipment
- BIM300 · Surface profilers
- CIEL series · Macro inspection equipment
- CIRIUS series · Defect inspection equipment
- EZ300 · Macro inspection equipment
- GALOIS211 · Crystal defect inspection equipment
- LX series · Macro inspection equipment
- MAGICS M5640 · Wafer substrate inspection equipment
Sources
Last updated: October 23, 2026